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Ultramicrotomy: The Cutting Edge of Sectioning


Date: Thursday, September 29th 2022
Time: 2pm London, 3pm Berlin, 5pm Dubai

Discover ways to refine your ultramicrotomy technique to improve electron microscopy (EM) imaging for a wide range of samples and EM techniques.

In this webinar, you will learn:

  • Ways experts refine their ultramicrotomy workflows for specific applications such as volume EM.
  • How to use more targeted sample sectioning for advanced imaging.
  • Methods for dealing with samples that demand array tomography or serial sectioning.

Learn how to do more with your samples, thanks to better sample preparation! The ability to image biological ultrastructure in EM relies on the sample preparation quality, but improving your workflow doesn’t necessarily mean a new setup is required. You’ll be surprised what improvements you can make by simply unlocking the full potential of your ultramicrotomy workflow.

Join this webinar where experts from three world-renowned institutions at the cutting edge of life science research share the latest advances in techniques in their workflows for a wide range of samples, with techniques such as volume EM, Tokayasu-CLEM, and array tomography.

Ultramicrotomy is a proven and universally accepted sample preparation technique for TEM, SEM, AFM, and more. It permits visualization and analysis of the fine internal structures of samples at nanometer-scale resolution by producing ultrathin sample sections quickly and cleanly. Ultramicrotomy offers several key advantages, including the size and homogeneity of the electron-transparent area within the sections and the speed of section production.


Welcome and introductions

Target trimming of resin blocks with crosshair for volume EM
Viola Oorschot, EMBL

Sectioning for array tomography – a quick start guide
Jemima Burden, UCL

Ultramicrotomy for diverse projects in an imaging facility: methods including 2D sections, Tokuyasu-CLEM, and array tomography
Jose Maria & Nicolas Schilling, University of Zurich

Q&A session and panel discussion

Viola Oorschot
Technical Officer
Electron Microscopy Core Facility at EMBL Heidelberg
Jemima Burden
Head of Electron Microscopy
MRC Laboratory for Molecular Cell Biology, University College London
José Maria Mateos Melero
Research Associate
Center for Microscopy and Image Analysis, University of Zurich
Nicolas Schilling
Research Associate
Center for Microscopy and Image Analysis, University of Zurich

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